Features

The Rem X Sem Cross is a next-generation high-resolution scanning electron microscope (SEM) that combines advanced technology and user-friendly design. Let’s explore its outstanding features!

High resolution observation using the Super Hybrid Lens (SHL)

The Rem X Sem Cross utilizes the Super Hybrid Lens (SHL), a cutting-edge technology that minimizes chromatic and spherical aberrations, resulting in enhanced resolution, especially at low accelerating voltages. This lens also allows for observations of magnetic materials and electron backscatter diffraction (EBSD) analysis without any difficulties.

Energy selection at low accelerating voltages

Equipped with an energy filter, the Rem X Sem Cross enables accurate selection of secondary electrons and backscattered electrons even at low accelerating voltages. This feature is particularly useful for composition observation of the specimen’s top surface, providing valuable insights into various materials.

Top surface imaging using Gentle Beam

The Gentle Beam mode of the Rem X Sem Cross applies a bias voltage to the specimen, reducing the speed of incident electrons and increasing the speed of released electrons. This technique allows for high-resolution images with a good signal-to-noise ratio, even at low specimen exposure energies. By utilizing the Gentle Beam mode, researchers can achieve even higher-resolution observations.

Acquisition of all information using multiple detectors

The Rem X Sem Cross is equipped with four types of detectors: upper electron detector (UED), upper secondary electron detector (USD), backscattered electron detector (BED), and lower electron detector (LED). By combining these detectors, researchers can acquire comprehensive information about the specimen’s surface, including its roughness and topography.

Application examples

The Rem X Sem Cross is highly versatile and suitable for various applications. It allows for observation at low accelerating voltages, making it possible to examine materials as thin as graphene sheets with atomic-level precision. Additionally, energy selection using the UED and USD detectors enables precise interpretation of images, revealing details that may not be obvious with traditional imaging techniques. The Rem X Sem Cross also excels in the observation of magnetic materials, allowing researchers to perform high-resolution analysis without magnetic field influences.

Specifications

The Rem X Sem Cross offers several principal options, including:

• Energy Dispersive X-ray Spectrometer (EDS)
• Wavelength Dispersive X-ray Spectrometer (WDS)
• Electron Backscatter Diffraction (EBSD) System
• Cathodoluminescence Detector (CLD)

Application

Discover the wide range of applications for the Rem X Sem Cross:

• Comparison of 3D Imaging Methods in Electron Microscopy for Biomaterials
• LIBnote
• Application of Scanning Electron Microscope to Dislocation Imaging in Steel
• High Angle Backscattered Electrons and Low Angle Backscattered Electrons
• Backscattered Electrons
• Rapid Characterization of Bacteria Using ClairScope and SpiralTOF

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More Info

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